Besides electrical noise, there are mechanical issues as well. I've seen systems fail memtest86+ after being moved, and the issue being fixed after reseating the DIMMs. ECC can catch mis-seated DIMMs very quickly.
The mechanical issues also act through increasing the sensitivity to electrical noise.
The imperfect contacts are equivalent to adding series resistors, possibly in parallel with parasitic capacitors, on the link traces, allowing a greater amplitude for the noise pulses.
The mechanical issues also act through increasing the sensitivity to electrical noise.
The imperfect contacts are equivalent to adding series resistors, possibly in parallel with parasitic capacitors, on the link traces, allowing a greater amplitude for the noise pulses.